Yield-SAFE: A parameter-sparse process-based dynamic model for predicting resource capture, growth and production in agroforestry systems
W. van der Werf, K.J. Keesman, P.J. Burgess, A.R. Graves, D. Pilbeam, L.D. Incoll, K. Metselaar, M.M. Mayus, R.J.J. Stappers, H. van Keulen, J.H.N. Palma, C. Dupraz
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