Use of wavelets to compare simulated yield patterns for precision agriculture at the field scale

A. Verhagen, A. Stein, V. Epinat

Research output: Contribution to journalArticleAcademicpeer-review

3 Citations (Scopus)

Abstract

In this paper spatial patterns of simulated water limited potato production for a farm field in the Netherlands are analyzed using wavelets. The simulated yield patterns are decomposed using wavelets into crystals with a varying resolution. These crystals are used to relate the simulated spatial patterns to weather conditions. We compare simulated yield patterns from 10 successive years to arrive at a prototype patterns that can be used as a basis for site-specific management. Typical patterns for dry and wet years are quantified using wavelets. Wavelets provide a mechanism to distinguish between spatial patterns and allow a quantitative approach for classification of these spatial patterns
Original languageEnglish
Pages (from-to)333-346
JournalPrecision Agriculture
Volume2
Issue number4
DOIs
Publication statusPublished - 2000

Fingerprint Dive into the research topics of 'Use of wavelets to compare simulated yield patterns for precision agriculture at the field scale'. Together they form a unique fingerprint.

  • Cite this