Towards outside-in development of integrated assessment systems

Research output: Chapter in Book/Report/Conference proceedingConference paperAcademicpeer-review

Original languageUndefined/Unknown
Title of host publicationEFITA conference '09. Proceedings of the 7th EFITA Conference, July 6-8, 2009, Wageningen, The Netherlands
EditorsA Bregt, S Wolfert, J.J.F. Wien, C Lokhorst
Place of PublicationWageningen
PublisherAcademic Publishers
Pages181-188
Publication statusPublished - 2009
EventEFITA conference '09, Wageningen, The Netherlands -
Duration: 6 Jul 20098 Jul 2009

Conference

ConferenceEFITA conference '09, Wageningen, The Netherlands
Period6/07/098/07/09

Cite this

Knapen, M. J. R., Verweij, P. J. F. M., & Wien, J. J. F. (2009). Towards outside-in development of integrated assessment systems. In A. Bregt, S. Wolfert, J. J. F. Wien, & C. Lokhorst (Eds.), EFITA conference '09. Proceedings of the 7th EFITA Conference, July 6-8, 2009, Wageningen, The Netherlands (pp. 181-188). Wageningen: Academic Publishers.
Knapen, M.J.R. ; Verweij, P.J.F.M. ; Wien, J.J.F. / Towards outside-in development of integrated assessment systems. EFITA conference '09. Proceedings of the 7th EFITA Conference, July 6-8, 2009, Wageningen, The Netherlands. editor / A Bregt ; S Wolfert ; J.J.F. Wien ; C Lokhorst. Wageningen : Academic Publishers, 2009. pp. 181-188
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title = "Towards outside-in development of integrated assessment systems",
author = "M.J.R. Knapen and P.J.F.M. Verweij and J.J.F. Wien",
year = "2009",
language = "Undefined/Unknown",
pages = "181--188",
editor = "A Bregt and S Wolfert and J.J.F. Wien and C Lokhorst",
booktitle = "EFITA conference '09. Proceedings of the 7th EFITA Conference, July 6-8, 2009, Wageningen, The Netherlands",
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Knapen, MJR, Verweij, PJFM & Wien, JJF 2009, Towards outside-in development of integrated assessment systems. in A Bregt, S Wolfert, JJF Wien & C Lokhorst (eds), EFITA conference '09. Proceedings of the 7th EFITA Conference, July 6-8, 2009, Wageningen, The Netherlands. Academic Publishers, Wageningen, pp. 181-188, EFITA conference '09, Wageningen, The Netherlands, 6/07/09.

Towards outside-in development of integrated assessment systems. / Knapen, M.J.R.; Verweij, P.J.F.M.; Wien, J.J.F.

EFITA conference '09. Proceedings of the 7th EFITA Conference, July 6-8, 2009, Wageningen, The Netherlands. ed. / A Bregt; S Wolfert; J.J.F. Wien; C Lokhorst. Wageningen : Academic Publishers, 2009. p. 181-188.

Research output: Chapter in Book/Report/Conference proceedingConference paperAcademicpeer-review

TY - GEN

T1 - Towards outside-in development of integrated assessment systems

AU - Knapen, M.J.R.

AU - Verweij, P.J.F.M.

AU - Wien, J.J.F.

PY - 2009

Y1 - 2009

M3 - Conference paper

SP - 181

EP - 188

BT - EFITA conference '09. Proceedings of the 7th EFITA Conference, July 6-8, 2009, Wageningen, The Netherlands

A2 - Bregt, A

A2 - Wolfert, S

A2 - Wien, J.J.F.

A2 - Lokhorst, C

PB - Academic Publishers

CY - Wageningen

ER -

Knapen MJR, Verweij PJFM, Wien JJF. Towards outside-in development of integrated assessment systems. In Bregt A, Wolfert S, Wien JJF, Lokhorst C, editors, EFITA conference '09. Proceedings of the 7th EFITA Conference, July 6-8, 2009, Wageningen, The Netherlands. Wageningen: Academic Publishers. 2009. p. 181-188