Towards outside-in development of integrated assessment systems

M.J.R. Knapen; P.J.F.M. Verweij; J.J.F. Wien

Towards outside-in development of integrated assessment systems

M.J.R. Knapen, P.J.F.M. Verweij, J.J.F. Wien

Wageningen Environmental Research

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › Academic › peer-review

Original language	English
Title of host publication	EFITA conference '09. Proceedings of the 7th EFITA Conference, July 6-8, 2009, Wageningen, The Netherlands
Editors	A Bregt, S Wolfert, J.J.F. Wien, C Lokhorst
Place of Publication	Wageningen
Publisher	Academic Publishers
Pages	181-188
Publication status	Published - 2009
Event	EFITA conference '09, Wageningen, The Netherlands - Duration: 6 Jul 2009 → 8 Jul 2009

Conference/symposium

Conference/symposium	EFITA conference '09, Wageningen, The Netherlands
Period	6/07/09 → 8/07/09

Cite this

@inproceedings{3b403da6b43841d2bd8bf839700ccdf8,

title = "Towards outside-in development of integrated assessment systems",

author = "M.J.R. Knapen and P.J.F.M. Verweij and J.J.F. Wien",

year = "2009",

language = "English",

pages = "181--188",

editor = "A Bregt and S Wolfert and J.J.F. Wien and C Lokhorst",

booktitle = "EFITA conference '09. Proceedings of the 7th EFITA Conference, July 6-8, 2009, Wageningen, The Netherlands",

publisher = "Academic Publishers",

note = "EFITA conference '09, Wageningen, The Netherlands ; Conference date: 06-07-2009 Through 08-07-2009",

}

Knapen, MJR , Verweij, PJFM & Wien, JJF 2009, Towards outside-in development of integrated assessment systems. in A Bregt, S Wolfert, JJF Wien & C Lokhorst (eds), EFITA conference '09. Proceedings of the 7th EFITA Conference, July 6-8, 2009, Wageningen, The Netherlands. Academic Publishers, Wageningen, pp. 181-188, EFITA conference '09, Wageningen, The Netherlands, 6/07/09.

Towards outside-in development of integrated assessment systems. / Knapen, M.J.R.; Verweij, P.J.F.M.; Wien, J.J.F.
EFITA conference '09. Proceedings of the 7th EFITA Conference, July 6-8, 2009, Wageningen, The Netherlands. ed. / A Bregt; S Wolfert; J.J.F. Wien; C Lokhorst. Wageningen: Academic Publishers, 2009. p. 181-188.

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › Academic › peer-review

TY - GEN

T1 - Towards outside-in development of integrated assessment systems

AU - Knapen, M.J.R.

AU - Verweij, P.J.F.M.

AU - Wien, J.J.F.

PY - 2009

Y1 - 2009

M3 - Conference paper

SP - 181

EP - 188

BT - EFITA conference '09. Proceedings of the 7th EFITA Conference, July 6-8, 2009, Wageningen, The Netherlands

A2 - Bregt, A

A2 - Wolfert, S

A2 - Wien, J.J.F.

A2 - Lokhorst, C

PB - Academic Publishers

CY - Wageningen

T2 - EFITA conference '09, Wageningen, The Netherlands

Y2 - 6 July 2009 through 8 July 2009

ER -