Specular and non-specular X-ray reflection from inorganic and organic multilayers.

D.K.G. de Boer; A.J.G. Leenaers; M.W.J. van der Wielen; M.A. Cohen Stuart; G.J. Fleer; R.P. Nieuwhof; A.T.M. Marcelis; E.J.R. Sudhölter

doi:10.1016/S0921-4526(98)00248-8

Specular and non-specular X-ray reflection from inorganic and organic multilayers.

D.K.G. de Boer, A.J.G. Leenaers, M.W.J. van der Wielen, M.A. Cohen Stuart, G.J. Fleer, R.P. Nieuwhof, A.T.M. Marcelis, E.J.R. Sudhölter

Organic Chemistry

Research output: Contribution to journal › Article › Academic › peer-review

8 Citations (Scopus)

Abstract

Specular and non-specular X-ray reflectivity measurements can be exploited to obtain interesting properties of layered materials such as electron-density profile and lateral and perpendicular structure of interface roughness. This will be illustrated using results on a nickel–carbon multilayer and a liquid-crystalline polymer.

Original language	English
Pages (from-to)	274-279
Journal	Physica B: Condensed Matter
Volume	248
DOIs	https://doi.org/10.1016/S0921-4526(98)00248-8
Publication status	Published - 1998

Keywords

Liquid-crystalline polymers
Nickel-carbon multilayer
Non-specular reflectivity

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10.1016/S0921-4526(98)00248-8

Cite this

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title = "Specular and non-specular X-ray reflection from inorganic and organic multilayers.",

abstract = "Specular and non-specular X-ray reflectivity measurements can be exploited to obtain interesting properties of layered materials such as electron-density profile and lateral and perpendicular structure of interface roughness. This will be illustrated using results on a nickel–carbon multilayer and a liquid-crystalline polymer.",

keywords = "Liquid-crystalline polymers, Nickel-carbon multilayer, Non-specular reflectivity",

author = "\{de Boer\}, D.K.G. and A.J.G. Leenaers and \{van der Wielen\}, M.W.J. and \{Cohen Stuart\}, M.A. and G.J. Fleer and R.P. Nieuwhof and A.T.M. Marcelis and E.J.R. Sudh{\"o}lter",

year = "1998",

doi = "10.1016/S0921-4526(98)00248-8",

language = "English",

volume = "248",

pages = "274--279",

journal = "Physica B: Condensed Matter",

issn = "0921-4526",

publisher = "Elsevier",

}

TY - JOUR

T1 - Specular and non-specular X-ray reflection from inorganic and organic multilayers.

AU - de Boer, D.K.G.

AU - Leenaers, A.J.G.

AU - van der Wielen, M.W.J.

AU - Cohen Stuart, M.A.

AU - Fleer, G.J.

AU - Nieuwhof, R.P.

AU - Marcelis, A.T.M.

AU - Sudhölter, E.J.R.

PY - 1998

Y1 - 1998

N2 - Specular and non-specular X-ray reflectivity measurements can be exploited to obtain interesting properties of layered materials such as electron-density profile and lateral and perpendicular structure of interface roughness. This will be illustrated using results on a nickel–carbon multilayer and a liquid-crystalline polymer.

AB - Specular and non-specular X-ray reflectivity measurements can be exploited to obtain interesting properties of layered materials such as electron-density profile and lateral and perpendicular structure of interface roughness. This will be illustrated using results on a nickel–carbon multilayer and a liquid-crystalline polymer.

KW - Liquid-crystalline polymers

KW - Nickel-carbon multilayer

KW - Non-specular reflectivity

U2 - 10.1016/S0921-4526(98)00248-8

DO - 10.1016/S0921-4526(98)00248-8

M3 - Article

SN - 0921-4526

VL - 248

SP - 274

EP - 279

JO - Physica B: Condensed Matter

JF - Physica B: Condensed Matter

ER -

Specular and non-specular X-ray reflection from inorganic and organic multilayers.

Abstract

Keywords

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