Specular and non-specular X-ray reflection from inorganic and organic multilayers.

D.K.G. de Boer; A.J.G. Leenaers; M.W.J. van der Wielen; M.A. Cohen Stuart; G.J. Fleer; R.P. Nieuwhof; A.T.M. Marcelis; E.J.R. Sudhölter

doi:10.1016/S0921-4526(98)00248-8

Specular and non-specular X-ray reflection from inorganic and organic multilayers.

D.K.G. de Boer
, A.J.G. Leenaers
, M.W.J. van der Wielen
, M.A. Cohen Stuart
, G.J. Fleer
, R.P. Nieuwhof
, A.T.M. Marcelis
, E.J.R. Sudhölter

Organic Chemistry

Research output: Contribution to journal › Article › Academic › peer-review

8 Citations (Scopus)

Abstract

Specular and non-specular X-ray reflectivity measurements can be exploited to obtain interesting properties of layered materials such as electron-density profile and lateral and perpendicular structure of interface roughness. This will be illustrated using results on a nickel–carbon multilayer and a liquid-crystalline polymer.

Original language	English
Pages (from-to)	274-279
Journal	Physica B: Condensed Matter
Volume	248
DOIs	https://doi.org/10.1016/S0921-4526(98)00248-8
Publication status	Published - 1998

Keywords

Liquid-crystalline polymers
Nickel-carbon multilayer
Non-specular reflectivity

Access to Document

10.1016/S0921-4526(98)00248-8

Cite this

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title = "Specular and non-specular X-ray reflection from inorganic and organic multilayers.",

abstract = "Specular and non-specular X-ray reflectivity measurements can be exploited to obtain interesting properties of layered materials such as electron-density profile and lateral and perpendicular structure of interface roughness. This will be illustrated using results on a nickel–carbon multilayer and a liquid-crystalline polymer.",

keywords = "Liquid-crystalline polymers, Nickel-carbon multilayer, Non-specular reflectivity",

author = "\{de Boer\}, D.K.G. and A.J.G. Leenaers and \{van der Wielen\}, M.W.J. and \{Cohen Stuart\}, M.A. and G.J. Fleer and R.P. Nieuwhof and A.T.M. Marcelis and E.J.R. Sudh{\"o}lter",

year = "1998",

doi = "10.1016/S0921-4526(98)00248-8",

language = "English",

volume = "248",

pages = "274--279",

journal = "Physica B: Condensed Matter",

issn = "0921-4526",

publisher = "Elsevier",

}

TY - JOUR

T1 - Specular and non-specular X-ray reflection from inorganic and organic multilayers.

AU - de Boer, D.K.G.

AU - Leenaers, A.J.G.

AU - van der Wielen, M.W.J.

AU - Cohen Stuart, M.A.

AU - Fleer, G.J.

AU - Nieuwhof, R.P.

AU - Marcelis, A.T.M.

AU - Sudhölter, E.J.R.

PY - 1998

Y1 - 1998

N2 - Specular and non-specular X-ray reflectivity measurements can be exploited to obtain interesting properties of layered materials such as electron-density profile and lateral and perpendicular structure of interface roughness. This will be illustrated using results on a nickel–carbon multilayer and a liquid-crystalline polymer.

AB - Specular and non-specular X-ray reflectivity measurements can be exploited to obtain interesting properties of layered materials such as electron-density profile and lateral and perpendicular structure of interface roughness. This will be illustrated using results on a nickel–carbon multilayer and a liquid-crystalline polymer.

KW - Liquid-crystalline polymers

KW - Nickel-carbon multilayer

KW - Non-specular reflectivity

U2 - 10.1016/S0921-4526(98)00248-8

DO - 10.1016/S0921-4526(98)00248-8

M3 - Article

SN - 0921-4526

VL - 248

SP - 274

EP - 279

JO - Physica B: Condensed Matter

JF - Physica B: Condensed Matter

ER -

Specular and non-specular X-ray reflection from inorganic and organic multilayers.

Abstract

Keywords

Access to Document

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