Specular and non-specular X-ray reflection from inorganic and organic multilayers.

D.K.G. de Boer, A.J.G. Leenaers, M.W.J. van der Wielen, M.A. Cohen Stuart, G.J. Fleer, R.P. Nieuwhof, A.T.M. Marcelis, E.J.R. Sudhölter

Research output: Contribution to journalArticleAcademicpeer-review

8 Citations (Scopus)

Abstract

Specular and non-specular X-ray reflectivity measurements can be exploited to obtain interesting properties of layered materials such as electron-density profile and lateral and perpendicular structure of interface roughness. This will be illustrated using results on a nickel–carbon multilayer and a liquid-crystalline polymer.
Original languageEnglish
Pages (from-to)274-279
JournalPhysica B: Condensed Matter
Volume248
DOIs
Publication statusPublished - 1998

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