Simulation of yield reduction by leaf rust in winter wheat, applied to the analysis of genetic variation in partial resistance.

H.J.W. van Roermund, C.J.T. Spitters

Research output: Contribution to journalArticleAcademicpeer-review

10 Citations (Scopus)
Original languageEnglish
Pages (from-to)17-28
JournalNetherlands Journal of Plant Pathology
Volume96
DOIs
Publication statusPublished - 1990

Keywords

  • competition for light
  • model
  • photosynthesis
  • Puccinia rcondita
  • Triticum aestivum

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