Quality determination of seed by X-ray testing and computerized image analysis

G. Polder, G.W.A.M. van der Heijden, W.J. van der Burg, J.W. Aartse

Research output: Chapter in Book/Report/Conference proceedingConference paper

Original languageEnglish
Title of host publicationThe proceedings of the 5th international conference on signal processing applications and technology, Dallas, TX, USA, 18-21 October 1994
Place of PublicationDallas
PublisherICSPAT
Pages1523-1528
Volume2
Publication statusPublished - 1994

Cite this