Production yield analysis - a new systematic method for improvement of raw material yield

D.J. Somsen; A. Capelle; J. Tramper

doi:10.1016/j.tifs.2003.11.002

Production yield analysis - a new systematic method for improvement of raw material yield

D.J. Somsen, A. Capelle, J. Tramper

Research output: Contribution to journal › Editorial › Academic › peer-review

3 Citations (Scopus)

Abstract

Production Yield Analysis (PYA) is a structured system approach to optimize the production yield of production processes. The paper outlines the developed method and the 10 basic steps of the PYA. The PYA-method makes it possible to calculate the Yield Index of a process. This dimensionless figure can be used in balanced scorecards; it visualises the true raw material efficiency of the production process and enables fact-based management, which is the key for yield improvement, cost cutting, waste reduction and saving raw materials. (C) 2003 Elsevier Ltd. All rights reserved.

Original language	English
Pages (from-to)	267-275
Journal	Trends in Food Science and Technology
Volume	15
Issue number	5
DOIs	https://doi.org/10.1016/j.tifs.2003.11.002
Publication status	Published - 2004

Keywords

fried french-fries

Access to Document

10.1016/j.tifs.2003.11.002

Cite this

@article{9cdeb80c417349f7a70367cdbb21f0be,

title = "Production yield analysis - a new systematic method for improvement of raw material yield",

abstract = "Production Yield Analysis (PYA) is a structured system approach to optimize the production yield of production processes. The paper outlines the developed method and the 10 basic steps of the PYA. The PYA-method makes it possible to calculate the Yield Index of a process. This dimensionless figure can be used in balanced scorecards; it visualises the true raw material efficiency of the production process and enables fact-based management, which is the key for yield improvement, cost cutting, waste reduction and saving raw materials. (C) 2003 Elsevier Ltd. All rights reserved.",

keywords = "fried french-fries",

author = "D.J. Somsen and A. Capelle and J. Tramper",

year = "2004",

doi = "10.1016/j.tifs.2003.11.002",

language = "English",

volume = "15",

pages = "267--275",

journal = "Trends in Food Science and Technology",

issn = "0924-2244",

publisher = "Elsevier",

number = "5",

}

TY - JOUR

T1 - Production yield analysis - a new systematic method for improvement of raw material yield

AU - Somsen, D.J.

AU - Capelle, A.

AU - Tramper, J.

PY - 2004

Y1 - 2004

N2 - Production Yield Analysis (PYA) is a structured system approach to optimize the production yield of production processes. The paper outlines the developed method and the 10 basic steps of the PYA. The PYA-method makes it possible to calculate the Yield Index of a process. This dimensionless figure can be used in balanced scorecards; it visualises the true raw material efficiency of the production process and enables fact-based management, which is the key for yield improvement, cost cutting, waste reduction and saving raw materials. (C) 2003 Elsevier Ltd. All rights reserved.

AB - Production Yield Analysis (PYA) is a structured system approach to optimize the production yield of production processes. The paper outlines the developed method and the 10 basic steps of the PYA. The PYA-method makes it possible to calculate the Yield Index of a process. This dimensionless figure can be used in balanced scorecards; it visualises the true raw material efficiency of the production process and enables fact-based management, which is the key for yield improvement, cost cutting, waste reduction and saving raw materials. (C) 2003 Elsevier Ltd. All rights reserved.

KW - fried french-fries

U2 - 10.1016/j.tifs.2003.11.002

DO - 10.1016/j.tifs.2003.11.002

M3 - Editorial

SN - 0924-2244

VL - 15

SP - 267

EP - 275

JO - Trends in Food Science and Technology

JF - Trends in Food Science and Technology

IS - 5

ER -

Production yield analysis - a new systematic method for improvement of raw material yield

Abstract

Keywords

Access to Document

Fingerprint

Cite this