Prediction of yield losses using relative leaf area models

L.A.P. Lotz, S. Christensen, D. Cloutier, C. Fernandez Quintanilla, A. Legere, C. Lemieux, P.J.W. Lutman, A. Pardo Iglesias, J. Salonen, M. Sattin, L. Stigliani, F. Tei

    Research output: Chapter in Book/Report/Conference proceedingConference paperAcademic

    Original languageUndefined/Unknown
    Title of host publicationProceedings Second International Weed Control Congress Copenhagen 1996
    Pages61-66
    Publication statusPublished - 1996

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