Non-resonant X-ray/laser interaction spectroscopy as a method for assessing charge competition, trapping and luminescence efficiency in wide band-gap materials

N.R.J. Poolton, A.J.J. Bos, J. Wallinga, J.T.M. De Haas, P. Dorenbos, L. De Vries, R.H. Kars, G.O. Jones, W. Drozdowski

Research output: Contribution to journalArticleAcademicpeer-review

9 Citations (Scopus)

Abstract

Using a conventional fast-shuttered laboratory X-ray source in combination with pulsed laser diode modules, the possibilities for undertaking X-ray/laser interaction spectroscopy in wide band-gap luminescent materials are explored. It is shown that in such materials, a variety of X-ray/laser timing sequences can extract complimentary information regarding the charge-carrier trapping, de-trapping and recombination processes. The effects on the luminescence are illustrated for six example materials (YPO4:Ce,Sm, Lu 3Al5O12:Pr, Al2O3:C, natural sodium feldspar NaAlSi3O8, cubic BN and type IIa natural diamond). By ramping the temperature from 10 to 320 K during repeated X-ray pump/laser-probe activation cycles, a rapid assessment can be made of the important thermally dependent changes to the charge carrier trapping competition processes.

Original languageEnglish
Pages (from-to)1404-1414
Number of pages11
JournalJournal of Luminescence
Volume130
Issue number8
DOIs
Publication statusPublished - Aug 2010
Externally publishedYes

Keywords

  • OSL
  • Radioluminescence
  • TL
  • Trapping

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