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Molecular Electronics at Metal/Semiconductor Junctions. Si Inversion by Sub-Nanometer Molecular Films
O. Yaffe, L.M.W. Scheres, S. Reddy Puniredd, N. Stein, A. Biller, R. Har Lavan, H. Shpaisman, H. Zuilhof, H. Haick, D. Cahen, A. Vilan
Research output: Contribution to journal › Article › Academic › peer-review
81
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(Scopus)