Method for taking a plurality of samples

A.J. Sprenkels; J.G. Bomer; C.J. Ingham; J.E.T. van Hylckama Vlieg; W.M. de Vos; A. van den Berg; P. ten Haaft

Method for taking a plurality of samples

A.J. Sprenkels (Inventor), J.G. Bomer (Inventor), C.J. Ingham (Inventor), J.E.T. van Hylckama Vlieg (Inventor), W.M. de Vos (Inventor), A. van den Berg (Inventor), P. ten Haaft (Inventor)

Research output: Patent

Abstract

The invention provides a method for taking a plurality of samples (200) from a substrate (40) with sample material (20) by using an optical microscope (1000) and a stamp (50). At least part of the stamp (50) is transparent and the stamp (50) is arranged in front of the objective (41). The elevations (58) of the stamp (50) are contacted with sample material (20) in a substrate (40).The samples (200) may be replicated to other substrates.

Original language	English
Patent number	WO2009078724
Priority date	19/12/07
Publication status	Published - 25 Jun 2009

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https://nl.espacenet.com/publicationDetails/originalDocument?CC=WO&NR=2009078724A1&KC=A1&FT=D&ND=3&date=20090625&DB=EPODOC&locale=nl_NL

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title = "Method for taking a plurality of samples",

abstract = "The invention provides a method for taking a plurality of samples (200) from a substrate (40) with sample material (20) by using an optical microscope (1000) and a stamp (50). At least part of the stamp (50) is transparent and the stamp (50) is arranged in front of the objective (41). The elevations (58) of the stamp (50) are contacted with sample material (20) in a substrate (40).The samples (200) may be replicated to other substrates.",

author = "A.J. Sprenkels and J.G. Bomer and C.J. Ingham and {van Hylckama Vlieg}, J.E.T. and {de Vos}, W.M. and {van den Berg}, A. and {ten Haaft}, P.",

year = "2009",

month = jun,

day = "25",

language = "English",

type = "Patent",

note = "WO2009078724",

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TY - PAT

T1 - Method for taking a plurality of samples

AU - Sprenkels, A.J.

AU - Bomer, J.G.

AU - Ingham, C.J.

AU - van Hylckama Vlieg, J.E.T.

AU - de Vos, W.M.

AU - van den Berg, A.

AU - ten Haaft, P.

PY - 2009/6/25

Y1 - 2009/6/25

N2 - The invention provides a method for taking a plurality of samples (200) from a substrate (40) with sample material (20) by using an optical microscope (1000) and a stamp (50). At least part of the stamp (50) is transparent and the stamp (50) is arranged in front of the objective (41). The elevations (58) of the stamp (50) are contacted with sample material (20) in a substrate (40).The samples (200) may be replicated to other substrates.

AB - The invention provides a method for taking a plurality of samples (200) from a substrate (40) with sample material (20) by using an optical microscope (1000) and a stamp (50). At least part of the stamp (50) is transparent and the stamp (50) is arranged in front of the objective (41). The elevations (58) of the stamp (50) are contacted with sample material (20) in a substrate (40).The samples (200) may be replicated to other substrates.

M3 - Patent

M1 - WO2009078724

ER -

Method for taking a plurality of samples

Abstract

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