Low-temperature scanning electron microscopy in seed research.

J. Nijsse, E. Erbe, N.B.M. Brantjes, J.H.N. Schel, W.P. Wergin

Research output: Contribution to journalAbstractAcademic

Original languageEnglish
Pages (from-to)182-183
JournalScanning
Volume20
Publication statusPublished - 1998

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