Interferometric phase difference segmentation using Fourier parameterised deformable models

C. Varekamp, D.H. Hoekman

Research output: Chapter in Book/Report/Conference proceedingConference paperAcademic

Original languageEnglish
Title of host publicationASCI'99 : proceedings of the Fifth Annual Conference of the Advanced School for Computing and Imaging, Heijen, The Netherlands, 15-17 June 1999 / M. Boasson, J.A. Kaandorp, J.F.M. Tonino and M.G. Vosselman (eds). - [S.l.] : [s.n.], 1999
Pages315-320
Publication statusPublished - 1999

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