Improving the Simulation of Crop Growth in Commercial Growers' Fields Using Soil Scans, Remote Sensing Imagery and Yield Monitor Data

F.K. van Evert, Frenk-Jan Baron, J.A. Booij, E.J.J. Meurs, P.A.J. van Oort, C. Kempenaar

Research output: Contribution to conference › Abstract

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Agriculture & Biology