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High-energy interference-free K-lines synchrotron X-ray fluorescence microscopy of rare earth elements in hyperaccumulator plants
Antony van der Ent*, Dennis Brueckner, Kathryn M. Spiers, Ken Vidar Falch, Gerald Falkenberg, Clément Layet, Wen Shen Liu, Hong Xiang Zheng, Marie Le Jean, Damien Blaudez
*Corresponding author for this work
Research output: Contribution to journal › Article › Academic › peer-review
6
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