A complex of Fusarium spp. causes head blight on wheat. Unlike the advances in the area of Fusarium genomics, progress in the understanding of the infection process and the possible resistance mechanisms of the host is slow. In wheat several different resistance mechanisms to Fusarium are currently recognised, including resistance to infection, resistance to colonisation and resistance to kernel infection. To exploit these natural types of resistance in wheat breeding programs it is important to monitor the infection process to identify and characterise the type and the level of resist-ance in wheat genotypes. We developed FusariumScreen TM to quickly identify different levels and mechanisms ofresistance in wheat. FusariumScreen TM is based on high throughput fluorescence imaging (HTFI) and enables fast,detailed, non-destructive studies of the Fusarium-cereal interactions. We inoculated wheat heads with a Fusarium::GFPtransformant and utilised FusariumScreen TM to identify the stress response of the plant and the colonisation process of the Fusarium::GFP strain. All images are quantified in an automated image analysis pipeline. The integration of the plantstress response and the increase of fungal biomass enables efficient screening of wheat lines and will generate invaluableinformation about the infection process and the genetic variation for resistance mechanisms in cereals to Fusarium species.
|Title of host publication||Proceedings of the 7th European Conference on Fungal Genetics, Copenhagen, Denmark, 17-20 April, 2004|
|Place of Publication||Copenhagen, Denmark|
|Publication status||Published - 2006|
|Event||1st FusariumScreen Workshop held in conjunction with the 7th European Conference on Fungal Genetics - |
Duration: 17 Apr 2004 → 20 Apr 2004
|Workshop||1st FusariumScreen Workshop held in conjunction with the 7th European Conference on Fungal Genetics|
|Period||17/04/04 → 20/04/04|