Comparisons of crop yield prediction using both microwave and optical data.

H.J.C. van Leeuwen, J.G.P.W. Clevers, B.A.M. Bouman, G.J. Rijckenberg, B. van den Broek, M. Borgeaud, J. Noll

Research output: Chapter in Book/Report/Conference proceedingConference paperAcademic

Original languageEnglish
Title of host publicationProc. MAC Europe '91 Final Results Workshop, Lenggries, Germany, ESA WPP-88
Publication statusPublished - 1995

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