Comparative evaluation of scanned stripping techniques: SSCP vs. SSV

R.M. Town, H.P. van Leeuwen

Research output: Contribution to journalArticleAcademicpeer-review

8 Citations (Scopus)

Abstract

The characteristic features of scanned deposition potential curves constructed from stripping chronopotentiometry (SSCP) and various modes of stripping voltammetry (SSV) are critically evaluated. The strengths and weaknesses of each method for identification of metal ion speciation features and susceptibility to typical interferences are described for conventional (HMDE) and microelectrodes, i.e. irreversibility in the electron transfer reaction, multi-metal resolution, intermetallic compound formation, homogeneous kinetics, induced metal adsorption, and requirement for excess ligand to avoid saturation at the electrode surface during reoxidation. The most advantageous stripping modes are those in which practically complete depletion of the accumulated metal is achieved during the reoxidation step, i.e. SCP with low stripping current and DC-SV with slow potential scan rate. Under these conditions there is a straightforward quantitative relationship between the amount of metal accumulated and the analytical signal. The slow rate of oxidation with these modes renders them practically immune to induced metal adsorption; they have a lower requirement for excess ligand in the sample solution and greater resistance to both irreversibility in the electrochemical oxidation and to interference from intermetallic compounds. Even in the case of nonreversible electrode processes, or for systems limited by complex formation/dissociation kinetics, depletive scanned deposition potential stripping curves allow complexation parameters to be determined from the shift in half-wave deposition potential, analogous to the DeFord-Hume approach for conventional voltammetry. SSCP has greater sensitivity, and provides greater resolution in multi-metal systems than does depletive DC-SSV, while SSV provides useful complementary information in some cases
Original languageEnglish
Pages (from-to)15-25
JournalCroatica Chemica Acta
Volume79
Issue number1
Publication statusPublished - 2006

Fingerprint

Metals
Voltammetry
Intermetallics
Ligands
Adsorption
Electrodes
Kinetics
Electrochemical oxidation
Microelectrodes
Complexation
Metal ions
Oxidation
Electrons

Keywords

  • deposition potential sscp
  • rotating-disk electrode
  • metal-complex systems
  • differential-pulse polarography
  • ion speciation analysis
  • voltammetric measurements
  • diffusion-coefficients
  • fundamental features
  • mercury-electrode
  • film electrodes

Cite this

@article{656860c965104a188004ec596405f0fe,
title = "Comparative evaluation of scanned stripping techniques: SSCP vs. SSV",
abstract = "The characteristic features of scanned deposition potential curves constructed from stripping chronopotentiometry (SSCP) and various modes of stripping voltammetry (SSV) are critically evaluated. The strengths and weaknesses of each method for identification of metal ion speciation features and susceptibility to typical interferences are described for conventional (HMDE) and microelectrodes, i.e. irreversibility in the electron transfer reaction, multi-metal resolution, intermetallic compound formation, homogeneous kinetics, induced metal adsorption, and requirement for excess ligand to avoid saturation at the electrode surface during reoxidation. The most advantageous stripping modes are those in which practically complete depletion of the accumulated metal is achieved during the reoxidation step, i.e. SCP with low stripping current and DC-SV with slow potential scan rate. Under these conditions there is a straightforward quantitative relationship between the amount of metal accumulated and the analytical signal. The slow rate of oxidation with these modes renders them practically immune to induced metal adsorption; they have a lower requirement for excess ligand in the sample solution and greater resistance to both irreversibility in the electrochemical oxidation and to interference from intermetallic compounds. Even in the case of nonreversible electrode processes, or for systems limited by complex formation/dissociation kinetics, depletive scanned deposition potential stripping curves allow complexation parameters to be determined from the shift in half-wave deposition potential, analogous to the DeFord-Hume approach for conventional voltammetry. SSCP has greater sensitivity, and provides greater resolution in multi-metal systems than does depletive DC-SSV, while SSV provides useful complementary information in some cases",
keywords = "deposition potential sscp, rotating-disk electrode, metal-complex systems, differential-pulse polarography, ion speciation analysis, voltammetric measurements, diffusion-coefficients, fundamental features, mercury-electrode, film electrodes",
author = "R.M. Town and {van Leeuwen}, H.P.",
year = "2006",
language = "English",
volume = "79",
pages = "15--25",
journal = "Croatica Chemica Acta",
issn = "0011-1643",
publisher = "Croatian Chemical Society",
number = "1",

}

Comparative evaluation of scanned stripping techniques: SSCP vs. SSV. / Town, R.M.; van Leeuwen, H.P.

In: Croatica Chemica Acta, Vol. 79, No. 1, 2006, p. 15-25.

Research output: Contribution to journalArticleAcademicpeer-review

TY - JOUR

T1 - Comparative evaluation of scanned stripping techniques: SSCP vs. SSV

AU - Town, R.M.

AU - van Leeuwen, H.P.

PY - 2006

Y1 - 2006

N2 - The characteristic features of scanned deposition potential curves constructed from stripping chronopotentiometry (SSCP) and various modes of stripping voltammetry (SSV) are critically evaluated. The strengths and weaknesses of each method for identification of metal ion speciation features and susceptibility to typical interferences are described for conventional (HMDE) and microelectrodes, i.e. irreversibility in the electron transfer reaction, multi-metal resolution, intermetallic compound formation, homogeneous kinetics, induced metal adsorption, and requirement for excess ligand to avoid saturation at the electrode surface during reoxidation. The most advantageous stripping modes are those in which practically complete depletion of the accumulated metal is achieved during the reoxidation step, i.e. SCP with low stripping current and DC-SV with slow potential scan rate. Under these conditions there is a straightforward quantitative relationship between the amount of metal accumulated and the analytical signal. The slow rate of oxidation with these modes renders them practically immune to induced metal adsorption; they have a lower requirement for excess ligand in the sample solution and greater resistance to both irreversibility in the electrochemical oxidation and to interference from intermetallic compounds. Even in the case of nonreversible electrode processes, or for systems limited by complex formation/dissociation kinetics, depletive scanned deposition potential stripping curves allow complexation parameters to be determined from the shift in half-wave deposition potential, analogous to the DeFord-Hume approach for conventional voltammetry. SSCP has greater sensitivity, and provides greater resolution in multi-metal systems than does depletive DC-SSV, while SSV provides useful complementary information in some cases

AB - The characteristic features of scanned deposition potential curves constructed from stripping chronopotentiometry (SSCP) and various modes of stripping voltammetry (SSV) are critically evaluated. The strengths and weaknesses of each method for identification of metal ion speciation features and susceptibility to typical interferences are described for conventional (HMDE) and microelectrodes, i.e. irreversibility in the electron transfer reaction, multi-metal resolution, intermetallic compound formation, homogeneous kinetics, induced metal adsorption, and requirement for excess ligand to avoid saturation at the electrode surface during reoxidation. The most advantageous stripping modes are those in which practically complete depletion of the accumulated metal is achieved during the reoxidation step, i.e. SCP with low stripping current and DC-SV with slow potential scan rate. Under these conditions there is a straightforward quantitative relationship between the amount of metal accumulated and the analytical signal. The slow rate of oxidation with these modes renders them practically immune to induced metal adsorption; they have a lower requirement for excess ligand in the sample solution and greater resistance to both irreversibility in the electrochemical oxidation and to interference from intermetallic compounds. Even in the case of nonreversible electrode processes, or for systems limited by complex formation/dissociation kinetics, depletive scanned deposition potential stripping curves allow complexation parameters to be determined from the shift in half-wave deposition potential, analogous to the DeFord-Hume approach for conventional voltammetry. SSCP has greater sensitivity, and provides greater resolution in multi-metal systems than does depletive DC-SSV, while SSV provides useful complementary information in some cases

KW - deposition potential sscp

KW - rotating-disk electrode

KW - metal-complex systems

KW - differential-pulse polarography

KW - ion speciation analysis

KW - voltammetric measurements

KW - diffusion-coefficients

KW - fundamental features

KW - mercury-electrode

KW - film electrodes

M3 - Article

VL - 79

SP - 15

EP - 25

JO - Croatica Chemica Acta

JF - Croatica Chemica Acta

SN - 0011-1643

IS - 1

ER -