Assimilating leaf area index into a simple crop model to predict soybean yield and maximum root depth at field scale

D.V. Gaso Melgar, A. Berger, L. Kooistra, A.J.W. de Wit

Research output: Chapter in Book/Report/Conference proceeding › Abstract

Original language	English
Title of host publication	iCROPM 2020 Book of Abstracts: Second international Crop Modelling Symposium
Subtitle of host publication	Crop modelling for the future
Editors	E. Justes, C. Pradal, P. Martre, M. Launay, S. Asseng, F. Ewert
Place of Publication	Montpellier
Publisher	CIRAD
Chapter	S1-P.14
Pages	287-288
Publication status	Published - Feb 2020

Access to Document

Gaso Melgar, D. V., Berger, A., Kooistra, L., & de Wit, A. J. W. (2020). Assimilating leaf area index into a simple crop model to predict soybean yield and maximum root depth at field scale. In E. Justes, C. Pradal, P. Martre, M. Launay, S. Asseng, & F. Ewert (Eds.), iCROPM 2020 Book of Abstracts: Second international Crop Modelling Symposium: Crop modelling for the future (pp. 287-288). CIRAD. https://www.alphavisa.com/icropm/2020/documents/iCROPM2020-Book-of-Abstracts.pdf#page=287

Gaso Melgar, D.V. ; Berger, A. ; Kooistra, L. et al. / Assimilating leaf area index into a simple crop model to predict soybean yield and maximum root depth at field scale. iCROPM 2020 Book of Abstracts: Second international Crop Modelling Symposium: Crop modelling for the future. editor / E. Justes ; C. Pradal ; P. Martre ; M. Launay ; S. Asseng ; F. Ewert. Montpellier : CIRAD, 2020. pp. 287-288

@inbook{7ba338bc59a7466b836ca5253499d61d,

title = "Assimilating leaf area index into a simple crop model to predict soybean yield and maximum root depth at field scale",

author = "{Gaso Melgar}, D.V. and A. Berger and L. Kooistra and {de Wit}, A.J.W.",

year = "2020",

month = feb,

language = "English",

pages = "287--288",

editor = "E. Justes and C. Pradal and P. Martre and M. Launay and S. Asseng and F. Ewert",

booktitle = "iCROPM 2020 Book of Abstracts: Second international Crop Modelling Symposium",

publisher = "CIRAD",

address = "France",

}

Gaso Melgar, DV, Berger, A, Kooistra, L & de Wit, AJW 2020, Assimilating leaf area index into a simple crop model to predict soybean yield and maximum root depth at field scale. in E Justes, C Pradal, P Martre, M Launay, S Asseng & F Ewert (eds), iCROPM 2020 Book of Abstracts: Second international Crop Modelling Symposium: Crop modelling for the future. CIRAD, Montpellier, pp. 287-288. <https://www.alphavisa.com/icropm/2020/documents/iCROPM2020-Book-of-Abstracts.pdf#page=287>

Assimilating leaf area index into a simple crop model to predict soybean yield and maximum root depth at field scale. / Gaso Melgar, D.V.; Berger, A.; Kooistra, L. et al.
iCROPM 2020 Book of Abstracts: Second international Crop Modelling Symposium: Crop modelling for the future. ed. / E. Justes; C. Pradal; P. Martre; M. Launay; S. Asseng; F. Ewert. Montpellier: CIRAD, 2020. p. 287-288.

Research output: Chapter in Book/Report/Conference proceeding › Abstract

TY - CHAP

T1 - Assimilating leaf area index into a simple crop model to predict soybean yield and maximum root depth at field scale

AU - Gaso Melgar, D.V.

AU - Berger, A.

AU - Kooistra, L.

AU - de Wit, A.J.W.

PY - 2020/2

Y1 - 2020/2

M3 - Abstract

SP - 287

EP - 288

BT - iCROPM 2020 Book of Abstracts: Second international Crop Modelling Symposium

A2 - Justes, E.

A2 - Pradal, C.

A2 - Martre, P.

A2 - Launay, M.

A2 - Asseng, S.

A2 - Ewert, F.

PB - CIRAD

CY - Montpellier

ER -

Gaso Melgar DV, Berger A, Kooistra L , de Wit AJW. Assimilating leaf area index into a simple crop model to predict soybean yield and maximum root depth at field scale. In Justes E, Pradal C, Martre P, Launay M, Asseng S, Ewert F, editors, iCROPM 2020 Book of Abstracts: Second international Crop Modelling Symposium: Crop modelling for the future. Montpellier: CIRAD. 2020. p. 287-288