Assimilating leaf area index into a simple crop model to predict soybean yield and maximum root depth at field scale

Research output: Chapter in Book/Report/Conference proceedingAbstract

Original languageEnglish
Title of host publicationiCROPM 2020 Book of Abstracts: Second international Crop Modelling Symposium
Subtitle of host publicationCrop modelling for the future
EditorsE. Justes, C. Pradal, P. Martre, M. Launay, S. Asseng, F. Ewert
Place of PublicationMontpellier
PublisherCIRAD/INRA
ChapterS1-P.14
Pages287-288
Publication statusPublished - Feb 2020

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