Acute stress resistance, DR and Lifespan in a multi-parent recombinant inbred line panel

J. Stastna, L.B. Snoek, J.M. Volkers, J.A.G. Riksen, A. Vujakovic, H. Schulenburg, J.E. Kammenga, S. Harvey

Research output: Contribution to conferencePosterProfessional

Original languageEnglish
Publication statusPublished - 2015
EventC. elegans 2015 20th international meeting -
Duration: 24 Jun 201528 Jun 2015

Conference

ConferenceC. elegans 2015 20th international meeting
Period24/06/1528/06/15

Cite this

Stastna, J., Snoek, L. B., Volkers, J. M., Riksen, J. A. G., Vujakovic, A., Schulenburg, H., ... Harvey, S. (2015). Acute stress resistance, DR and Lifespan in a multi-parent recombinant inbred line panel. Poster session presented at C. elegans 2015 20th international meeting, .