Acute stress resistance, DR and Lifespan in a multi-parent recombinant inbred line panel

J. Stastna, L.B. Snoek, J.M. Volkers, J.A.G. Riksen, A. Vujakovic, H. Schulenburg, J.E. Kammenga, S. Harvey

Research output: Contribution to conference › Poster › Professional

Original language	English
Publication status	Published - 2015
Event	C. elegans 2015 20th international meeting - Duration: 24 Jun 2015 → 28 Jun 2015

Conference	C. elegans 2015 20th international meeting
Period	24/06/15 → 28/06/15

Stastna, J., Snoek, L. B., Volkers, J. M., Riksen, J. A. G., Vujakovic, A., Schulenburg, H., ... Harvey, S. (2015). Acute stress resistance, DR and Lifespan in a multi-parent recombinant inbred line panel. Poster session presented at C. elegans 2015 20th international meeting, .

@conference{06ae3ab9b0d746019e1ae2e37a7398e5,

title = "Acute stress resistance, DR and Lifespan in a multi-parent recombinant inbred line panel",

author = "J. Stastna and L.B. Snoek and J.M. Volkers and J.A.G. Riksen and A. Vujakovic and H. Schulenburg and J.E. Kammenga and S. Harvey",

year = "2015",

language = "English",

note = "C. elegans 2015 20th international meeting ; Conference date: 24-06-2015 Through 28-06-2015",

}