Acute stress resistance, DR and Lifespan in a multi-parent recombinant inbred line panel

J. Stastna, L.B. Snoek, J.M. Volkers, J.A.G. Riksen, A. Vujakovic, H. Schulenburg, J.E. Kammenga, S. Harvey

Research output: Contribution to conference › Poster › Professional

Original language	English
Publication status	Published - 2015
Event	C. elegans 2015 20th international meeting - Duration: 24 Jun 2015 → 28 Jun 2015

Conference	C. elegans 2015 20th international meeting
Period	24/06/15 → 28/06/15

Cite this

@conference{06ae3ab9b0d746019e1ae2e37a7398e5,

title = "Acute stress resistance, DR and Lifespan in a multi-parent recombinant inbred line panel",

author = "J. Stastna and L.B. Snoek and J.M. Volkers and J.A.G. Riksen and A. Vujakovic and H. Schulenburg and J.E. Kammenga and S. Harvey",

year = "2015",

language = "English",

note = "C. elegans 2015 20th international meeting ; Conference date: 24-06-2015 Through 28-06-2015",

}

TY - CONF

T1 - Acute stress resistance, DR and Lifespan in a multi-parent recombinant inbred line panel

AU - Stastna, J.

AU - Snoek, L.B.

AU - Volkers, J.M.

AU - Riksen, J.A.G.

AU - Vujakovic, A.

AU - Schulenburg, H.

AU - Kammenga, J.E.

AU - Harvey, S.

PY - 2015

Y1 - 2015

M3 - Poster

T2 - C. elegans 2015 20th international meeting

Y2 - 24 June 2015 through 28 June 2015

ER -