A method for sensitivity analysis to assess the effects of measurement error in multiple exposure variables using external validation data

George O. Agogo^*, Hilko van der Voet, Pieter van 't Veer, Pietro Ferrari, David C. Muller, Emilio Sánchez-Cantalejo, Christina Bamia, Tonje Braaten, Sven Knüppel, Ingegerd Johansson, Fred A. van Eeuwijk, Hendriek C. Boshuizen

^*Corresponding author for this work

Research output: Contribution to journal › Article › Academic › peer-review

2 Citations (Scopus)

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