A landmark-based approach of shape dissimilarity

G.W.A.M. van der Heijden, A.M. Vossepoel

    Research output: Chapter in Book/Report/Conference proceedingConference paper

    10 Citations (Scopus)
    Original languageEnglish
    Title of host publicationProceedings of the 13111 International Association of Pattern Recognition, Volume 1. The institute of electrical and electronics engineers (IEEE). Computer Society Press, Los Alamitos, USA
    Pages120-124
    Publication statusPublished - 1996

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