A landmark-based approach of shape dissimilarity

G.W.A.M. van der Heijden; A.M. Vossepoel

A landmark-based approach of shape dissimilarity

G.W.A.M. van der Heijden, A.M. Vossepoel

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › Academic

Original language	English
Title of host publication	Proceedings of the 13111 International Association of Pattern Recognition, Volume 1. The institute of electrical and electronics engineers (IEEE). Computer Society Press, Los Alamitos, USA
Pages	120-124
Publication status	Published - 1996

Cite this

@inproceedings{4240b568bb9d447f9adc42f2312c0d51,

title = "A landmark-based approach of shape dissimilarity",

author = "{van der Heijden}, G.W.A.M. and A.M. Vossepoel",

year = "1996",

language = "English",

pages = "120--124",

booktitle = "Proceedings of the 13111 International Association of Pattern Recognition, Volume 1. The institute of electrical and electronics engineers (IEEE). Computer Society Press, Los Alamitos, USA",

}

A landmark-based approach of shape dissimilarity. / van der Heijden, G.W.A.M.; Vossepoel, A.M.
Proceedings of the 13111 International Association of Pattern Recognition, Volume 1. The institute of electrical and electronics engineers (IEEE). Computer Society Press, Los Alamitos, USA. 1996. p. 120-124.

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › Academic

TY - GEN

T1 - A landmark-based approach of shape dissimilarity

AU - van der Heijden, G.W.A.M.

AU - Vossepoel, A.M.

PY - 1996

Y1 - 1996

M3 - Conference paper

SP - 120

EP - 124

BT - Proceedings of the 13111 International Association of Pattern Recognition, Volume 1. The institute of electrical and electronics engineers (IEEE). Computer Society Press, Los Alamitos, USA

ER -