A controlled deterioration test for Arabidopsis thaliana reveals genetic variation in seed quality

K. Tesnier, H.M. Strookman-Donkers, J.G. van Pijlen, A.H.M. van der Geest, R.J. Bino, S.P.C. Groot

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Cite this

@article{c5d5625d5ed74677b14f389dd0d20459,

title = "A controlled deterioration test for Arabidopsis thaliana reveals genetic variation in seed quality",

author = "K. Tesnier and H.M. Strookman-Donkers and {van Pijlen}, J.G. and {van der Geest}, A.H.M. and R.J. Bino and S.P.C. Groot",

year = "2002",

language = "English",

volume = "30",

pages = "149--165",

journal = "Seed Science and Technology",

issn = "0251-0952",

publisher = "International Seed Testing Association",

}

TY - JOUR

T1 - A controlled deterioration test for Arabidopsis thaliana reveals genetic variation in seed quality

AU - Tesnier, K.

AU - Strookman-Donkers, H.M.

AU - van Pijlen, J.G.

AU - van der Geest, A.H.M.

AU - Bino, R.J.

AU - Groot, S.P.C.

PY - 2002

Y1 - 2002

M3 - Article

SN - 0251-0952

VL - 30

SP - 149

EP - 165

JO - Seed Science and Technology

JF - Seed Science and Technology

ER -