A controlled deterioration test for Arabidopsis thaliana reveals genetic variation in seed quality

K. Tesnier, H.M. Strookman-Donkers, J.G. van Pijlen, A.H.M. van der Geest, R.J. Bino, S.P.C. Groot

    Research output: Contribution to journalArticleAcademicpeer-review

    59 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)149-165
    JournalSeed Science and Technology
    Volume30
    Publication statusPublished - 2002

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