A survey of deleterious variants in highly managed commercial layer lines

Derks, M. F. L. (Presenter), Megens, H. J. W. C. (Contributor), Bosse, M. (Contributor), Gross, C. (Contributor), M. Reinders (Contributor), de Ridder, D. (Contributor), Groenen, M. (Contributor)

Activity: Other

Description

Poster presentatie
Period4 Apr 2017
Held atBioSB 2017
Event typeConference
LocationLunteren, Netherlands
Degree of RecognitionNational